On the Choice of Loss Functions and Their Estimations for Relevant Parameter Selection in Image Restoration Techniques

Seminar Date(s)
Seminar Location
Jacobs Hall, Room 2512, Jacobs School of Engineering, 9500 Gilman Dr, La Jolla, San Diego, California 92093
Seminar Speaker
Charles Deledalle
Université de Bordeaux, France
Charles deledalle
Abstract

The Stein unbiased risk estimator has become popular for parameter selection in image restoration algorithms. It estimates the square error loss between the reconstruction and the unknown image of interest, and hence, can be used as an objective for parameter selection. This estimator and its extensions all rely on modeling noise as perturbations whose distribution belongs to the exponential family. However, under non-Gaussian noise, we will show that optimizing the square error loss can lead to selecting irrelevant parameters. In this talk, we will consider more appropriate loss functions and will discuss the challenging problem of estimating them.

Seminar Speaker Bio
Charles Deledalle received the Ph.D. degree in signal and image processing from Telecom ParisTech, France, in 2011. He made a postdoctoral fellowship in applied mathematics at Université Paris IX, France, in 2012. He is a CNRS researcher at Université de Bordeaux, France. He is currently a visiting scholar at UCSD. His research interests include image reconstruction, variational and statistical modeling, and parameter estimation. He received the IEEE ICIP Best Student Paper Award in 2010, the ISIS/EEA/GRETSI Best PhD Award in 2012, and the IEEE GRSS Transactions Prize Paper Award in 2016.
Seminar Contact
Travis Spackman
tspackman@eng.ucsd.edu